Our lab counts with two scanning force microscopes (SFMs) operating in ambient and nitrogen atmosphere which are dedicated to the investigation of the electronic/electrical properties (C-SFM, KPFM) and mechanical properties (friction, adhesion, elasticity) with nanoscale resolution. SFM measurements can be performed for “in-operando” devices, in particular OFETs, having access to the correlation between nanoscale properties and device performances. We have two portable UHV chambers for organic film growth from the vapour phase, equiped with different evaporators and electrical in-situ transport measurements. These chambers are furnished with beryllium windows to allow real-time growth studies by X-ray diffraction at synchrotron light facilities.