We are currently looking for a technician in Scanning Probe Microscopy (SPM). The position is funded by the ICMAB subproject part of the Infrastructure for Correlative Analysis of Energy Materials (InCAEM) project, within the Advanced Materials program of the “Planes Complementarios de I+D+I of the Plan de Recuperación, Transformación y Resiliencia” (PRTR), under Institutional Agreement.
** Possible international candidates are requested to take into account the fulfillment of requirements in due term as the position is intended to start in January 2024 through the CSIC job bank.
The subproject includes the installation of a multipurpose atomic force microscope (mp-AFM), to be set-up within a Scanning Probe Microscopy (SPM) platform at a dedicated laboratory at the ALBA facility. The objective of the SPM platform is to offer a wide range of correlative advanced characterization of materials for energy by means of a variety of operation modes and under different operation environments. The high flexibility of the mp-AFM will permit correlative experiments with specific beamlines of the synchrotron ALBA.
Main Tasks and responsibilities:
– Installation of the mp-SPM and supplies systems.
– Testing of the different operation modes under diverse environmental conditions to assure full functionality.
– Adapting and optimizing user-friendly operation protocols.
– Performing preliminary test of correlative experiments with at least one ALBA beamline.
– Commissioning of the instrument and performing experiments with the new set-up.
Opportunities:
The hired person will have the unique opportunity to carry out her/his job in the scientific active and lively environment of ICMAB and the synchrotron ALBA. During the first period, she/he will acquire the knowledge to master state-of-the-art techniques for organic thin films growth and novel characterization instruments with the purpose of performing SPM measurements correlated to experiments of diverse X-ray beamlines at ALBA. The collaborative activity at international level will be an unique chance for a professional career.
Application and requirements:
- Expertise in Scanning Probe Microscopy and knowledge on surface science and materials characterization.
- Experience in synchrotron-based techniques will be considered an added value.
- Good level of English.
We encourage interested candidates to send a CV and motivation letter to the following researchers:
Prof. Carmen Ocal: cocal@icmab.es
Dr. Daniel Martín-Jiménez: dmartin@icmab.es
NOTE: Only preselected applications will get an answer and appointment to carry out an interview.
Please note that the deadline indicated is an estimation, and the position will remain open until we find the right candidate.
